Design of V-shaped cantilevers for enhanced multifrequency AFM measurements

• Mehrnoosh Damircheli and
• Babak Eslami

Beilstein J. Nanotechnol. 2020, 11, 1525–1541, doi:10.3762/bjnano.11.135

• their measurements and investigations, there is a need for further expansion of the field. One of the current limitation in the field is the theoretical understanding of V-shaped cantilevers in multifrequency AFM. Microcantilevers are one of the most important components of micro-electromechanical

• systems (MEMS), superparamagnetic particle embedded microprobe (SPEM) sensors, or lab-on chips devices [5][6][7][8]. Microcantilevers are also an important component of atomic force microscopes (AFM). Due to their importance in AFM, there have been many studies on modeling the cantilevers to represent the

Ultrasensitive detection of cadmium ions using a microcantilever-based piezoresistive sensor for groundwater

• Dinesh Rotake,
• Anand Darji and
• Nitin Kale

Beilstein J. Nanotechnol. 2020, 11, 1242–1253, doi:10.3762/bjnano.11.108

• the WHO limit of 3 μg/L. Keywords: BioMEMS; heavy metal ions (HMIs); limit of detection (LOD); microcantilevers; microfluidics; micro-electromechanical systems (MEMS); piezoresistive sensors; SAM (self-assembled monolayers); World Health Organization (WHO); Introduction Water is fundamentally

Electrospun one-dimensional nanostructures: a new horizon for gas sensing materials

• Muhammad Imran,
• Nunzio Motta and
• Mahnaz Shafiei

Beilstein J. Nanotechnol. 2018, 9, 2128–2170, doi:10.3762/bjnano.9.202

• sensing platforms (i.e., micro-electromechanical systems (MEMs)). The electrospinning process is governed by various parameters such as viscosity, conductivity, molecular weight of fiber components, surface tension of polymer solution, electric potential, working distance, and flow rate. Each parameter

Recent highlights in nanoscale and mesoscale friction

• Andrea Vanossi,
• Dirk Dietzel,
• Andre Schirmeisen,
• Ernst Meyer,
• Rémy Pawlak,
• Thilo Glatzel,
• Marcin Kisiel,
• Shigeki Kawai and
• Nicola Manini

Beilstein J. Nanotechnol. 2018, 9, 1995–2014, doi:10.3762/bjnano.9.190

Review of nanostructured devices for thermoelectric applications

• Giovanni Pennelli

Beilstein J. Nanotechnol. 2014, 5, 1268–1284, doi:10.3762/bjnano.5.141

• as integrated circuits and the fabrication of micro-electromechanical systems (MEMS), this technique has been improved and developed in the course of the years, with respect to both etching/polimerizating chemical agents and process temperature and step time [106]. Silicon pillars smaller than 100 nm

The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl–Tomlinson model and the simulation of vibration-induced friction reduction

• W. Merlijn van Spengen,
• Viviane Turq and
• Joost W. M. Frenken

Beilstein J. Nanotechnol. 2010, 1, 163–171, doi:10.3762/bjnano.1.20

• cedex 9, France Leiden University, LION, Niels Bohrweg 2, 2333CA, Leiden, The Netherlands 10.3762/bjnano.1.20 Abstract We have replaced the periodic Prandtl–Tomlinson model with an atomic-scale friction model with a random roughness term describing the surface roughness of micro-electromechanical

• systems (MEMS) devices with sliding surfaces. This new model is shown to exhibit the same features as previously reported experimental MEMS friction loop data. The correlation function of the surface roughness is shown to play a critical role in the modelling. It is experimentally obtained by probing the